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Surface State Effects on N+P Doped Electron Detector
Journal of Instrumentation. 2011; 6(12):Art. no. C12019
Dummy photo Krister Hammarling
EKS

Publication type:
Article in journal

Permanent link (URI):
http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-15251

URL:
http://iopscience.iop.org/1748-0221/6/12/C12019

ISSN:
1748-0221

Abstract:

Surface states and interface recombination velocity that exist between detector interfaces have always been known to affect the performance of a detector. This article describes how the detector performance varies when the doping profile is altered. When irradiated with electrons, the results show that while changes in the doping profile have an effect of the detector responsivity with respect to the interface recombination velocity

Vs, there is no visible effect with respect tofixed oxide charge

Qfotherwise known as interface fixed charge density.




Authors:
Esebamen O, Hammarling K, Thungström G, Nilsson H

Internal co-authors:
Göran Thungström
Prof. Hans-Erik Nilsson, NMT

SCB areas:
Annan elektroteknik och elektronik